@misc{indiciae6db3ff910e7e,
  title = {One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strain in-situ multi-microscopy testing},
  author = {Johan Hoefnagels and Marc van Maris and Tijmen Vermeij},
  year = {2019},
  doi = {10.1111/str.12330},
  url = {https://arxiv.org/abs/1904.12047},
  note = {Source identifier: 1904.12047}
}