TY  - RPRT
TI  - One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strain in-situ multi-microscopy testing
AU  - Johan Hoefnagels
AU  - Marc van Maris
AU  - Tijmen Vermeij
PY  - 2019
DO  - 10.1111/str.12330
UR  - https://arxiv.org/abs/1904.12047
ID  - 1904.12047
ER  -