TY  - RPRT
TI  - X-ray photoelectron spectroscopy, Raman and photoluminescence studies on formation of defects in Cu:ZnO thin films and its role in non-linear optical features
AU  - Albin Antony
AU  - P. Poornesh
AU  - I. V. Kityk
AU  - K. Ozga
AU  - J. Jedryk
AU  - P. Rakus
AU  - A. Wojciechowski
PY  - 2019
DO  - 10.1088/1555-6611/aacd93
UR  - https://arxiv.org/abs/1904.12127
ID  - 1904.12127
ER  -