TY  - RPRT
TI  - Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
AU  - Simon Rerucha
AU  - Andrew Yacoot
AU  - Tuan M Pham
AU  - Martin Cizek
AU  - Vaclav Hucl
AU  - Josef Lazar
AU  - Ondrej Cip
PY  - 2019
DO  - 10.1088/1361-6501/aa5ab9
UR  - https://arxiv.org/abs/1905.00795
ID  - 1905.00795
ER  -