TY  - RPRT
TI  - SUMMARIZED: Efficient Framework for Analyzing Multidimensional Process Traces under Edit-distance Constraint
AU  - Phuong Nguyen
AU  - Vatche Ishakian
AU  - Vinod Muthusamy
AU  - Aleksander Slominski
PY  - 2019
UR  - https://arxiv.org/abs/1905.00983
ID  - 1905.00983
ER  -