TY  - RPRT
TI  - Better Data Labelling with EMBLEM (and how that Impacts Defect Prediction)
AU  - Huy Tu
AU  - Zhe Yu
AU  - Tim Menzies
PY  - 2020
UR  - https://arxiv.org/abs/1905.01719
ID  - 1905.01719
ER  -