TY  - RPRT
TI  - Crystallization kinetics and role of stress in Al induced layer exchange crystallization process of amorphous SiGe thin film on glass
AU  - Twisha Sain
AU  - Ch. Kishan Singh
AU  - S. Ilango
AU  - T. Mathews
PY  - 2019
DO  - 10.1063/1.5115539
UR  - https://arxiv.org/abs/1905.02986
ID  - 1905.02986
ER  -