TY  - RPRT
TI  - Evidence of Systematic Errors in $Spitzer$ Microlens Parallax Measurements
AU  - Naoki Koshimoto
AU  - David P. Bennett
PY  - 2020
DO  - 10.3847/1538-3881/abaf4e
UR  - https://arxiv.org/abs/1905.05794
ID  - 1905.05794
ER  -