TY  - RPRT
TI  - Uneven illumination surface defects inspection based on convolutional neural network
AU  - Hao Wu
AU  - Yulong Liu
AU  - Wenbin Gao
AU  - Xiangrong Xu
PY  - 2023
UR  - https://arxiv.org/abs/1905.06683
ID  - 1905.06683
ER  -