TY  - RPRT
TI  - On the measurements of assembly bias and splashback radius using optically selected galaxy clusters
AU  - Tomomi Sunayama
AU  - Surhud More
PY  - 2019
DO  - 10.1093/mnras/stz2832
UR  - https://arxiv.org/abs/1905.07557
ID  - 1905.07557
ER  -