@misc{indiciaea1abc33d15d8,
  title = {Thermal Boundary Resistance Measurement and Analysis Across SiC/SiO2 Interface},
  author = {Shichen Deng and Chengdi Xiao and Jiale Yuan and Dengke Ma and Junhui Li and Nuo Yang and Hu He},
  year = {2025},
  doi = {10.1063/1.5111157},
  url = {https://arxiv.org/abs/1905.08570},
  note = {Source identifier: 1905.08570}
}