TY  - RPRT
TI  - Ultrametric Fitting by Gradient Descent
AU  - Giovanni Chierchia
AU  - Benjamin Perret
PY  - 2019
DO  - 10.1088/1742-5468/abc62d
UR  - https://arxiv.org/abs/1905.10566
ID  - 1905.10566
ER  -