TY  - RPRT
TI  - Strain-induced increase of dielectric constant in EuO thin film
AU  - Alireza Kashir
AU  - Hyeon-Woo Jeong
AU  - Woochan Jung
AU  - Yoon Hee Jeong
AU  - Gil-Ho Lee
PY  - 2019
DO  - 10.1088/2053-1591/ab405a
UR  - https://arxiv.org/abs/1905.11051
ID  - 1905.11051
ER  -