@misc{indiciaecced23c754b1,
  title = {Ultra-Slow Dynamic Annealing of Neutron-induced Defects in n-type Silicon: Role of Charge Carriers},
  author = {Ying Zhang and Yang Liu and Hang Zhou and Ping Yang and Jie Zhao and Yu Song},
  year = {2020},
  doi = {10.1140/epjp/s13360-020-00849-z},
  url = {https://arxiv.org/abs/1906.00519},
  note = {Source identifier: 1906.00519}
}