TY  - RPRT
TI  - Ultra-Slow Dynamic Annealing of Neutron-induced Defects in n-type Silicon: Role of Charge Carriers
AU  - Ying Zhang
AU  - Yang Liu
AU  - Hang Zhou
AU  - Ping Yang
AU  - Jie Zhao
AU  - Yu Song
PY  - 2020
DO  - 10.1140/epjp/s13360-020-00849-z
UR  - https://arxiv.org/abs/1906.00519
ID  - 1906.00519
ER  -