@misc{indiciaedf23d385776a,
  title = {Depth, relaxation and temperature dependence of defect complexes in scanning transmission electron microscopy},
  author = {Thomas Aarholt and Ymir Frodason and Øystein Prytz},
  year = {2019},
  url = {https://arxiv.org/abs/1906.01471},
  note = {Source identifier: 1906.01471}
}