TY  - RPRT
TI  - Depth, relaxation and temperature dependence of defect complexes in scanning transmission electron microscopy
AU  - Thomas Aarholt
AU  - Ymir Frodason
AU  - Øystein Prytz
PY  - 2019
UR  - https://arxiv.org/abs/1906.01471
ID  - 1906.01471
ER  -