TY  - RPRT
TI  - Standard-Based EBSD: Fingerprinting of Order and Orientation in Materials
AU  - Aimo Winkelmann
AU  - Grzegorz Cios
AU  - Tomasz Tokarski
AU  - Gert Nolze
AU  - Ralf Hielscher
AU  - Tomasz Kocieł
PY  - 2019
UR  - https://arxiv.org/abs/1906.01717
ID  - 1906.01717
ER  -