@misc{indiciae0109f4e803d0,
  title = {Deep Learning based Cephalometric Landmark Identification using Landmark-dependent Multi-scale Patches},
  author = {Chonho Lee and Chihiro Tanikawa and Jae-Yeon Lim and Takashi Yamashiro},
  year = {2019},
  url = {https://arxiv.org/abs/1906.02961},
  note = {Source identifier: 1906.02961}
}