TY  - RPRT
TI  - Deep Learning based Cephalometric Landmark Identification using Landmark-dependent Multi-scale Patches
AU  - Chonho Lee
AU  - Chihiro Tanikawa
AU  - Jae-Yeon Lim
AU  - Takashi Yamashiro
PY  - 2019
UR  - https://arxiv.org/abs/1906.02961
ID  - 1906.02961
ER  -