TY  - RPRT
TI  - Oxide layer thickness effects on the resistance switching characteristics of Ti/TiO2-NT/Au structure
AU  - I. B. Dorosheva
AU  - A. S. Vokhmintsev
AU  - R. V. Kamalov
AU  - A. O. Gryaznov
AU  - I. A. Weinstein
PY  - 2019
DO  - 10.1109/usbereit.2018.8384604
UR  - https://arxiv.org/abs/1906.06555
ID  - 1906.06555
ER  -