@misc{indiciae5d25531d57c2,
  title = {Incorporation and control of defects with quantum functionality during sublimation growth of cubic silicon carbide},
  author = {Michael Schöler and Maximilian W. Lederer and Philipp Schuh and Peter J. Wellmann},
  year = {2019},
  url = {https://arxiv.org/abs/1906.07433},
  note = {Source identifier: 1906.07433}
}