TY  - RPRT
TI  - Incorporation and control of defects with quantum functionality during sublimation growth of cubic silicon carbide
AU  - Michael Schöler
AU  - Maximilian W. Lederer
AU  - Philipp Schuh
AU  - Peter J. Wellmann
PY  - 2019
UR  - https://arxiv.org/abs/1906.07433
ID  - 1906.07433
ER  -