@misc{indiciaebd65aa68644a,
  title = {Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model},
  author = {Yang Liu and Ying Zhang and Mu Lan and Chunsheng Jiang and Yu Song},
  year = {2019},
  url = {https://arxiv.org/abs/1907.01408},
  note = {Source identifier: 1907.01408}
}