TY  - RPRT
TI  - Enhanced low-flux sensitivity (ELFS) effect of neutron-induced displacement damage in bipolar devices: physical mechanism and parametric model
AU  - Yang Liu
AU  - Ying Zhang
AU  - Mu Lan
AU  - Chunsheng Jiang
AU  - Yu Song
PY  - 2019
UR  - https://arxiv.org/abs/1907.01408
ID  - 1907.01408
ER  -