TY  - RPRT
TI  - Exploring effective charge in electromigration using machine learning
AU  - Yu-chen Liu
AU  - Benjamin Afflerbach
AU  - Ryan Jacobs
AU  - Shih-kang Lin
AU  - Dane Morgan
PY  - 2019
DO  - 10.1557/mrc.2019.63
UR  - https://arxiv.org/abs/1907.01480
ID  - 1907.01480
ER  -