TY  - RPRT
TI  - Segmented ion-trap fabrication using high precision stacked wafers
AU  - Simon Ragg
AU  - Chiara Decaroli
AU  - Thomas Lutz
AU  - Jonathan P. Home
PY  - 2019
DO  - 10.1063/1.5119785
UR  - https://arxiv.org/abs/1907.05329
ID  - 1907.05329
ER  -