TY  - RPRT
TI  - Characterization of L21 order in Co2FeSi thin films on GaAs
AU  - B Jenichen
AU  - T Hentschel
AU  - J Herfort
AU  - X Kong
AU  - A Trampert
AU  - I Zizak
PY  - 2019
DO  - 10.1088/1742-6596/471/1/012022
UR  - https://arxiv.org/abs/1907.05869
ID  - 1907.05869
ER  -