TY  - RPRT
TI  - Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects
AU  - Amin Rassekh
AU  - Farzan Jazaeri
AU  - Morteza Fathipour
AU  - Jean-Michel Sallese
PY  - 2019
DO  - 10.1109/ted.2019.2944193
UR  - https://arxiv.org/abs/1907.08429
ID  - 1907.08429
ER  -