@misc{indiciaefa0b3cecb789,
  title = {On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements},
  author = {Joseph A. Sherwin and Akhlesh Lakhtakia and Ian J. Hodgkinson},
  year = {2019},
  doi = {10.1016/s0030-4018(02)01672-3},
  url = {https://arxiv.org/abs/1907.10740},
  note = {Source identifier: 1907.10740}
}