TY  - RPRT
TI  - On Calibration of a Nominal Structure-Property Relationship Model for Chiral Sculptured Thin Films by Axial Transmittance Measurements
AU  - Joseph A. Sherwin
AU  - Akhlesh Lakhtakia
AU  - Ian J. Hodgkinson
PY  - 2019
DO  - 10.1016/s0030-4018(02)01672-3
UR  - https://arxiv.org/abs/1907.10740
ID  - 1907.10740
ER  -