TY  - RPRT
TI  - Pattern evolution in bending dielectric-elastomeric bilayers
AU  - Yipin Su
AU  - Bin Wu
AU  - Weiqiu Chen
AU  - Michel Destrade
PY  - 2019
DO  - 10.1016/j.jmps.2019.07.013
UR  - https://arxiv.org/abs/1907.11783
ID  - 1907.11783
ER  -