TY  - RPRT
TI  - A Critical Review on the Electromigration Effect, the Electroplastic Effect, and Perspectives on the Effects of Electric Current Upon Alloy Phase Stability
AU  - Yu-chen Liu
AU  - Shih-kang Lin
PY  - 2019
DO  - 10.1007/s11837-019-03661-y
UR  - https://arxiv.org/abs/1908.01170
ID  - 1908.01170
ER  -