TY  - RPRT
TI  - Real-time Deep Learning at the Edge for Scalable Reliability Modeling of Si-MOSFET Power Electronics Converters
AU  - Mohammadreza Baharani
AU  - Mehrdad Biglarbegian
AU  - Babak Parkhideh
AU  - Hamed Tabkhi
PY  - 2019
DO  - 10.1109/jiot.2019.2896174
UR  - https://arxiv.org/abs/1908.01244
ID  - 1908.01244
ER  -