@misc{indiciaea552cb322dec,
  title = {High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors},
  author = {Adeboye Stephen Oyeniran and Raimund Ubar and Maksim Jenihhin and Cemil Cem Gürsoy and Jaan Raik},
  year = {2019},
  doi = {10.1109/ets.2019.8791526},
  url = {https://arxiv.org/abs/1908.02986},
  note = {Source identifier: 1908.02986}
}