TY  - RPRT
TI  - Measured Effectiveness of Deep N-well Substrate Isolation in a 65nm Pixel Readout Chip Prototype
AU  - Peilian Liu
AU  - Maurice Garcia-Sciveres
AU  - Timon Heim
AU  - Amanda Krieger
AU  - Dario Gnani
PY  - 2020
DO  - 10.1016/j.nima.2020.163842
UR  - https://arxiv.org/abs/1908.06182
ID  - 1908.06182
ER  -