TY  - RPRT
TI  - Meyer-Neldel and anti-Meyer-Neldel rule in microcrystalline silicon and silicon carbide examined with Hall measurements
AU  - Torsten Bronger
AU  - Oleksandr Astakhov
AU  - Reinhard Carius
PY  - 2019
UR  - https://arxiv.org/abs/1908.06516
ID  - 1908.06516
ER  -