@misc{indiciaefc047e2cfaef,
  title = {Measurement-induced criticality in random quantum circuits},
  author = {Chao-Ming Jian and Yi-Zhuang You and Romain Vasseur and Andreas W. W. Ludwig},
  year = {2019},
  doi = {10.1103/physrevb.101.104302},
  url = {https://arxiv.org/abs/1908.08051},
  note = {Source identifier: 1908.08051}
}