TY  - RPRT
TI  - High-throughput fabrication and semi-automated characterization of oxide thin film transistors
AU  - Yanbing Han
AU  - Sage Bauers
AU  - Qun Zhang
AU  - Andriy Zakutayev
PY  - 2019
DO  - 10.1088/1674-1056/ab5d05
UR  - https://arxiv.org/abs/1908.08287
ID  - 1908.08287
ER  -