@misc{indiciaefeca1b6aed99,
  title = {A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence},
  author = {K. V. Nikolaev and V. Soltwisch and P. Hoenicke and F. Scholze and J. de la Rie and S. N. Yakunin and I. A. Makhotkin and R. W. E. van de Kruijs and F. Bijkerk},
  year = {2019},
  doi = {10.1107/s1600577519016345},
  url = {https://arxiv.org/abs/1908.11452},
  note = {Source identifier: 1908.11452}
}