TY  - RPRT
TI  - Bin-wise Temperature Scaling (BTS): Improvement in Confidence Calibration Performance through Simple Scaling Techniques
AU  - Byeongmoon Ji
AU  - Hyemin Jung
AU  - Jihyeun Yoon
AU  - Kyungyul Kim
AU  - Younghak Shin
PY  - 2019
UR  - https://arxiv.org/abs/1908.11528
ID  - 1908.11528
ER  -