TY  - RPRT
TI  - Measurement, Characterization and Modeling of LoRa Technology in Multi-floor Buildings
AU  - Weitao Xu
AU  - Jun Young Kim
AU  - Walter Huang
AU  - Salil Kanhere
AU  - Sanjay Jha
AU  - Wen Hu
PY  - 2019
UR  - https://arxiv.org/abs/1909.03900
ID  - 1909.03900
ER  -