TY  - RPRT
TI  - Determination of the electric field in highly-irradiated silicon sensors using edge-TCT measurements
AU  - R. Klanner
AU  - G. Kramberger
AU  - I. Mandic
AU  - M. Mikuz
AU  - M. Milovanovic
AU  - J. Schwandt
PY  - 2019
DO  - 10.1016/j.nima.2019.162987
UR  - https://arxiv.org/abs/1909.04953
ID  - 1909.04953
ER  -