@misc{indiciae3d24318d6c09,
  title = {Characterization of in-gap states in epitaxial CoFe2O4(111) layers grown on Al2O3(111)/Si(111) by resonant inelastic x-ray scattering},
  author = {Yuki K. Wakabayashi and Takashi Tokushima and Kentaro Kuga and Hiroshi Yomosa and Masaki Oura and Hidenori Fujiwara and Tetsuya Ishikawa and Masaaki Tanaka and Takayuki Kiss and Ryosho Nakane},
  year = {2019},
  url = {https://arxiv.org/abs/1910.05734},
  note = {Source identifier: 1910.05734}
}