TY  - RPRT
TI  - Characterization of in-gap states in epitaxial CoFe2O4(111) layers grown on Al2O3(111)/Si(111) by resonant inelastic x-ray scattering
AU  - Yuki K. Wakabayashi
AU  - Takashi Tokushima
AU  - Kentaro Kuga
AU  - Hiroshi Yomosa
AU  - Masaki Oura
AU  - Hidenori Fujiwara
AU  - Tetsuya Ishikawa
AU  - Masaaki Tanaka
AU  - Takayuki Kiss
AU  - Ryosho Nakane
PY  - 2019
UR  - https://arxiv.org/abs/1910.05734
ID  - 1910.05734
ER  -