@misc{indiciae68fb40c4acd7,
  title = {A realistic dimension-independent approach for charged defect calculations in semiconductors},
  author = {Jin Xiao and Kaike Yang and Dan Guo and Tao Shen and Jun-Wei Luo and Shu-Shen Li and Su-Huai Wei and Hui-Xiong Deng},
  year = {2019},
  doi = {10.1103/physrevb.101.165306},
  url = {https://arxiv.org/abs/1910.08762},
  note = {Source identifier: 1910.08762}
}