TY  - RPRT
TI  - In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering
AU  - Tuan Thien Tran
AU  - Lukas Jablonka
AU  - Christian Lavoie
AU  - Zhen Zhang
AU  - Daniel Primetzhofer
PY  - 2019
UR  - https://arxiv.org/abs/1910.09393
ID  - 1910.09393
ER  -