@misc{indiciae9f4444e8d022,
  title = {Investigation of gating effect in Si spin MOSFET},
  author = {Soobeom Lee and Fabien Rortais and Ryo Ohshima and Yuichiro Ando and Minori Goto and Shinji Miwa and Yoshishige Suzuki and Hayato Koike and Masashi Shiraishi},
  year = {2019},
  doi = {10.1063/1.5131823},
  url = {https://arxiv.org/abs/1910.13072},
  note = {Source identifier: 1910.13072}
}