@misc{indiciae907766a4c898,
  title = {Beam Test of the PIN-diode Readout Units with Electron Energies from 5 to 40 GeV at CERN SPS},
  author = {Chengbo Li and Xiaomei Li and Qiuying Meng and Jing Zhou and Shuhua Zhou and Jian Yuan},
  year = {2019},
  doi = {10.1140/epja/s10050-020-00211-y},
  url = {https://arxiv.org/abs/1910.13098},
  note = {Source identifier: 1910.13098}
}