TY  - RPRT
TI  - Beam Test of the PIN-diode Readout Units with Electron Energies from 5 to 40 GeV at CERN SPS
AU  - Chengbo Li
AU  - Xiaomei Li
AU  - Qiuying Meng
AU  - Jing Zhou
AU  - Shuhua Zhou
AU  - Jian Yuan
PY  - 2019
DO  - 10.1140/epja/s10050-020-00211-y
UR  - https://arxiv.org/abs/1910.13098
ID  - 1910.13098
ER  -